List of Contributors.................................................................................
Preface ...............................................................................................
Acknowledgments ................................................................................
CHAPTER 1 Introduction............................................................ 1
Michio Inagaki, Feiyu Kang
1.1 Carbon Materials............................................................... 1
1.2 Characterization of Carbon Materials.................................... 3
1.3 Structure of the Present Book.............................................. 5
References.............................................................................. 6
CHAPTER 2 X-ray Powder Diffraction ......................................... 7
Norio Iwashita
2.1 Introduction...................................................................... 7
2.2 X-ray Diffraction Pattern of Carbon Materials........................ 8
2.3 Parameters Determined by X-ray Diffraction.........................10
2.4 Instrumentation ................................................................11
2.5 Specifications for Measurement ..........................................14
2.5.1 Preparation of Sample for X-ray Measurements............ 14
2.5.2 Measurement and Intensity Correction of Diffraction
Profiles.................................................................. 14
2.5.3 Correction of Diffraction Angle With Internal
Standard ................................................................ 16
2.5.4 Determination of Full Width at Half Maximum
Intensity ................................................................ 17
2.5.5 Accuracy of the Values Determined............................ 18
2.6 Degree of Graphitization ...................................................18
2.7 Key Issues for Measurement...............................................21
2.7.1 Diffraction Pattern................................................... 21
2.7.2 Use of Internal Standard........................................... 21
2.7.3 Use of Thin Sample Holder....................................... 22
2.7.4 Indexing the Diffraction Line .................................... 23
2.7.5 Separation into Component Profiles............................ 23
2.8 Concluding Remarks.........................................................24
References.............................................................................24