基本信息 书名:国外物理名著系列17 版 纳米薄膜分析基础 定价：68元 作者:(美)阿尔弗德 等编著 出版社：科学出版 出版日期：2008-06-01 ISBN：9787030222596 字数： 页码： 版次：1 装帧：精装 开本：16开 商品重量： 编辑推荐 本书主要研究了材料表面及从表面到几十乃至100纳米深的结构与构成。主要讨论了用入射粒子和光子来量化结构并进行成分和深度分析的材料表征方法以及详细介绍了各种分析和扫描探针显微技术。本书可供物理学工作者参考学习。 内容提要 现代科学技术（从材料科学到集成电路）已深入到纳米层次。从薄膜到场效应传感器，研究的重点是如何把尺度从微米量级减小到纳米量级。纳米薄膜分析一书主要研究了材料表面及从表面到几十乃至100纳米深的结构与构成。主要讨论了用入射粒子和光子来量化结构并进行成分和深度分析的材料表征方法。 本书讨论了通过入射光子或粒子刻蚀纳米材料来表征材料的方法，入射的粒子能够激发出可测的粒子或光子，这正是表征材料的依据，纳米尺度材料分析实验会用到大量入射粒子与待测粒子束的相互作用。其中较重要的有原子碰撞、卢瑟福背散射、离子遂道、衍射、光子吸收、辐射与非辐射阳县跃迁以及核反应。本书详细介绍了各种分析和扫描探针显微技术。 目录 Preface1. An Overview：Concepts，Units，and the Bohr Atom 1.1 Introduction 1.2 Nomenclature 1.3 Energies，Units，and Particles 1.4 Particle-Wave Duality and Lattice Spacing 1.5 The Bohr Model Problems2. Atomic Collisions and Backscattering Spectrometry 2.1 Introduction 2.2 Kinematics of Elastic Collisions 2.3 Rutherford Backscattering Spectrometry 2.4 Scattering Cross Section and Impact Parameter 2.5 Central Force Scattering 2.6 Scattering Cross Section：Two-Body 2.7 Deviations from Rutherford Scattering at Low and High Energy 2.8 Low-Energy Ion Scattering 2.9 Forward Recoil Spectrometry 2.10 Center of Mass to Laboratory Transformation Problems3. Energy Loss of Light Ions and Backscattering Depth Profiles 3.1 Introduction 3.2 General Picture of Energy Loss and Units of Energy Loss 3.3 Energy Loss of MeV Light Ions in Solids 3.4 Energy Loss in Compounds Bragg's Rule 3.5 The Energy Width in Backscattering 3.6 The Shape of the Backscattering Spectrum 3.7 Depth Profiles with Rutherford Scattering 3.8 Depth Resolution and Energy-Loss Straggling 3.9 Hydrogen and Deuterium Depth Profiles 3.10 Ranges of H and He Ions 3.11 Sputtering and Limits to Sensitivity 3.12 Summary of Scattering Relations Problems4. Sputter Depth Profiles and Secondary Ion Mass Spectroscopy 4.1 Introduction 4.2 Sputtering by Ion Bombardment—General Concepts 4.3 Nuclear Energy Loss 4.4 Sputtering Yield 4.5 Secondary Ion Mass Spectroscopy (SIMS) 4.6 Secondary Neutral Mass Spectroscopy (SNMS) 4.7 Preferential Sputtering and Depth Profiles 4.8 Interface Broadening and Ion Mixing 4.9 Thomas-Fermi Statistical Model of the Atom Problems5. Ion Channeling 5.1 Introduction 5.2 Channeling in Single Crystals 5.3 Lattice Location of Impurities in Crystals 5.4 Channeling Flux Distributions 89 5.5 Surface Interaction via a Two-Atom Model 5.6 The Surface Peak 5.7 Substrate Shadowing：Epitaxial Au on Ag(111) 5.8 Epitaxial Growth 5.9 Thin Film Analysis Problems6. Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies 6.1 Introduction 6.2 Electron Spectroscopies：Energy Analysis 6.3 Escape Depth and Detected Volume 6.4 Inelastic Electron-Electron Collisions 6.5 Electron Impact Ionization Cross Section 6.6 Plasmons 6.7 The Electron Mean Free Path 6.8 Influence of Thin Film Morphology on Electron Attenuation 6.9 Range of Electrons in Solids 6.10 Electron Energy Loss Spectroscopy (EELS) 6.11 Bremsstrahlung Problems7. X-ray Diffraction 7.1 Introduction 7.2 Bragg's Law in Real Space 7.3 Coefficient of Thermal Expansion Measurements 7.4 Texture Measurements in Polycrystalline Thin Films 7.5 Strain Measurements in Epitaxial Layers 7.6 Crystalline Structure 7.7 Allowed Reflections and Relative Intensities Problems8. Electron Diffraction 8.1 Introduction 8.2 Reciprocal Space 8.3 Laue Equations 8.4 Bragg's Law 8.5 Ewald Sphere Synthesis 8.6 The Electron Microscope 8.7 Indexing Diffraction Patterns Problems9. Photon Absorption in Solids and EXAFS 9.1 Introduction 9.2 The Schrodinger Equation 9.3 Wave Functions 9.4 Quantum Numbers，Electron Configuration,and Notation 9.5 Transition Probability 9.6 Photoelectric Effect Square-Well Approximation 9.7 Photoelectric Transition Probability for a Hydrogenic Atom 9.8 X-ray Absorption 9.9 Extended X-ray Absorption Fine Structure (EXAFS) 9.10 Time-Dependent Perturbation Theory Problems10. X-ray Photoelectron Spectroscopy 10.1 Introduction 10.2 Experimental Considerations 10.3 Kinetic Energy of Photoelectrons 10.4 Photoelectron Energy Spectrum 10.5 Binding Energy and Final-State Effects 10.6 Binding Energy Shifts—Chemical Shifts 10.7 Quantitative Analysis Problems11. Radiative Transitions and the Electron Microprobe 11.1 Introduction 11.2 Nomenclature in X-Ray Spectroscopy 11.3 Dipole Selection Rules 11.4 Electron Microprobe 11.5 Transition Rate for Spontaneous Emission 11.6 Transition Rate for Kα Emission in Ni 11.7 Electron Microprobe：Quantitative Analysis 11.8 Particle-Induced X-Ray Emission (PIXE) 11.9 Evaluation of the Transition Probability for Radiative Transitions 11.10 Calculation of the Kβ/Kα Ratio Problems12. Nonradiative Transitions and Auger Electron Spectroscopy 12.1 Introduction 12.2 Auger Transitions 12.3 Yield of Auger Electrons and Fluorescence Yield 12.4 Atomic Level Width and Lifetimes 12.5 Auger Electron Spectroscopy 12.6 Quantitative Analysis 12.7 Auger Depth Profiles Problems13. Nuclear Techniques：Activation Analysis and Prompt Radiation Analysis 13.1 Introduction 13.2 Q Values and Kinetic Energies 13.3 Radioactive Decay 13.4 Radioactive Decay Law 13.5 Radionuclide Production 13.6 Activation Analysis 13.7 Prompt Radiation Analysis Problems14. Scanning Probe Microscopy 14.1 Introduction 14.2 Scanning Tunneling Microscopy 14.3 Atomic Force MicroscopyAppendix 1. Km for 4He as Projectile and Integer Target MassAppendix 2. Rutherford Scattering Cross Section of the Elements for 1 MeV4HeiAppendix 3. 4He Stopping Cross SectionsAppendix 4. Electron Configurations and Ionization Potentials of AtomsAppendix 5. Atomic Scattering FactorsAppendix 6. Electron Binding EnergiesAppendix 7. X-Ray Wavelengths (nm)Appendix 8. Mass Absorption Coefficient and DensitiesAppendix 9. KLL Auger Energies (eV)Appendix 10. Table of the ElementsAppendix 11. Table of Fluoresence Yields for K，L，and M ShellsAppendix 12. Physical Constants，Conversions，and Useful CombinationsAppendix 13. AcronymsIndex 作者介绍 暂无相关内容 序言 暂无相关内容
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