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戎咏华 著 / 高等教育出版社 / 2012-01 / 精装
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材料科学与工程著作系列:微观组织的分析电子显微学表征(英文版)
《材料科学与工程著作系列:微观组织的分析电子显微学表征(英文版)》介绍了分析电子显微学(AEM)的基本概念和操作技术,聚集于相恋和形变中位错的AEM研究。同时通过大量的例子阐述衍射晶体学的物理概念和数学分析方法,例如相变中位向关系的定量预测等,以便读者加深理解和拓展视野。
《材料科学与工程著作系列:微观组织的分析电子显微学表征(英文版)》可作为材料科学与工程以及凝聚态物理领域的学者和研究生的参考书。
戎咏华,上海交通大学材料科学与工程学院教授。
Chapter1AnalyticalElectronMicroscope(AEM)1.1BriefintroductionofAEMhistory1.2InteractionbetweenelectronsandspecimenandsignalsusedbyAEM1.3Electronwavelengthandelectromagneticlens1.3.1Electronwavelength1.3.2Electromagneticlens1.4StructureandfunctionofAEM1.4.1Illuminationsystem1.4.2Specimenholders1.4.3Imagingsystem1.4.4Imagerecording1.4.5Powersupplysystemandvacuumsystem1.4.6Computercontrol'1.5Theprincipleofimaging,magnifyinganddiffracting1.6Theoreticalresolutionlimit1.7Depthoffocusanddepthoffield1.8Sphericalaberration-c0rrectedTEMsReferencesChapter2SpecimenPreparation2.1Traditionaltechniques2.1.1Replica2.1.2Preparationofpowders2.1.3Filmpreparationforplanview2.1.4Filmpreparationfromabulkmetallicsample.2.1.5Filmpreparationfromabulknonmetalticsample.2.2Specialtechniques2.2.1Cross-sectionalspecimenpreparation2.2.2Cleavingandsmallanglecleavagetechnique2.2.3Ultramicrotomy2.2.4FocusedionbeamtechniqueReferencesChapter3ElectronDiffraction3.1ComparisonofelectrondiffractionwithX-raydiffraction3.2Conditionsofdiffraction3.2.1Geometriccondition3.2.2Physicalcondition3.2.3DiffractiondeviatingfromexactBraggCondition3.3Basicequationusedforanalysisofelectrondiffractionpattern3.3.1Diffractioninanelectrondiffractometer3.3.2DiffractioninaTEM3.4Principleandoperationofselectedareaelectrondiffraction3.5Rotationofimagerelativetodiffractionpattern3.6Diffractionpatternsofpolycrystalandtheirapplications3.6.1Formationandgeometricfeaturesofdiffractionpatternsforpolycrystal3.6.2Applicationsofringpatterns3.7Geometricfeaturesofdiffractionpatternsofsinglecrystals3.7.1Geometricfeaturesanddiffractionintensityofasinglecrystalpattern3.7.2Indexingmethodsofsinglecrystaldiffractionpatterns3.8Mainapplicationsofsinglecrystalpattern3.8.1Identificationofphases3.8.2Determinationoforientationrelationship3.9Diffractionspotshiftbystackingfaultsanddeterminationofstackingfaultprobability3.9.1Diffractionfromplanardefect3.9.2DeterminationofstackingfaultprobabilityinHCPcrystal3.9.3DeterminationofstackingfaultprobabilityinFCCcrystal3.10Systematictiltingtechniqueanditsapplications3.10.1Systematictiltingtechniquebydoubletiltholder.3.10.2Determinationofelectronbeamdirection……Chapter4MathematicsAnalysisinElectronDiffractionandCrystallographyChapter5DiffractionContrastChapter6highResolutionandHighSpatialResolutionofAnalyticaelectronMicroscopyAppendixIndex
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